Download e-book for kindle: Encyclopedia of Materials Characterization: Surfaces, by Charles Evans, Richard Brundle, Wilson

By Charles Evans, Richard Brundle, Wilson

ISBN-10: 0750691689

ISBN-13: 9780750691680

Encyclopedia of fabrics Characterization is a complete quantity on analytical recommendations utilized in fabrics technological know-how for the characterization of surfaces, interfaces and skinny movies. This flagship quantity within the fabrics Characterization sequence is a special, stand-alone reference for fabrics technology practitioners, technique engineers, scholars and someone with a necessity to grasp in regards to the functions on hand in fabrics research. An encyclopedia of fifty concise articles, this booklet can also be a pragmatic significant other to the impending books within the sequence. It describes widely-ranging innovations in a jargon-free demeanour and contains precis pages for every strategy to provide a brief survey of its services.

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Additional info for Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

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1 Rutherford Backscattering Spectrometry (RBS) analysis is performed by bombarding a sample target with a monoenergetic beam of high-energy particles, typically helium, with an energy of a few MeV. A fraction of the incident atoms scatter backwards from heavier atoms in the near-surface region of the target material, and usually are detected with a solid state detector that measures their energy. The energy of a backscattered particle is related to the depth and mass of the target atom, while the number of backscattered particles detected from any given element is proportional to concentration.

Information Vibrational frequencies of chemical bonds Element Range All, but not element specific Destructive No Chemical bonding information Yes, identification of hnctional groups Depth profiling No, not under standard conditions Depth Probed Sample dependent, from pm’s to 10 nm Detection limits Ranges from undetectable to e l O I 3 bonds/cc. 5 cm to 20 pm Imaging/mapping Available, but not routinely used Sample requirements Solid, liquid, or gas in all forms; vacuum not required Main use Qualitative and quantitative determination of chemical species, both trace and bulk, for solids and thin films.

2 Energetic recoil ions, 'H+ and 2H+,are produced when 4He+ ions having energies in the MeV range undergo elastic nucleus-nucleus collisions within a hydrogen- or deuterium-containing solid sample. Energy spectrometry of the recoiling ions identifies their mass and depth of origin. The total hydrogen content of a thin layer may be determined directly from the recoil fluence. In combination with Rutherford Backscattering (RBS) analysis of the same sample, elastic recoil spectra provide concentration profiles and complete compositional analysis of near-surface regions of the sample material.

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Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) by Charles Evans, Richard Brundle, Wilson

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