High-resolution electron microscopy - download pdf or read online

By John C. H. Spence

ISBN-10: 0198509154

ISBN-13: 9780198509158

The invention of the Nanotube in 1991 via electron microscopy ha ushered within the period of Nanoscience. The atomic-resolution electron microscope has been an important instrument during this attempt. This booklet supplies the fundamental theoretical history had to know the way electron microscopes let us see atoms, togeher with hugely functional recommendation for electron microscope operators. The publication covers the usefulness of seeing atoms within the semiconductor undefined, in fabrics technological know-how and condensed subject physics. Biologists have lately used the atomic-resolution electron microscope to procure third-dimensional pictures of the Ribosome, paintings wihich is roofed during this booklet. The ebook additionally indicates how the facility to work out atomic preparations has helped us comprehend the houses of topic. This new 3rd variation of the normal textual content keeps the early sections at the basics of electron optics, linear imaging conception with partial coherence and multiple-scattering concept. additionally preserved are up to date previous sections on sensible tools, with special step by step money owed of the techniques had to receive the best quality photographs of the association of atoms in skinny crystals utilizing a contemporary electron microscope. resources of software program for picture interpretation and electron-optical layout also are given

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26) unreliable for many modern lenses. In particular, since the focal length of a modern objective lens is not large compared with the pole-piece dimensions, these lenses cannot be treated as ‘thin’ lenses. 6 The objective lens The objective lens, which immediately follows the specimen, is the heart of the microscope. 11a), the magnification provided by this lens ensures that rays travel at very small angles to the optic axis in all subsequent lenses. We shall see that lens aberrations increase sharply with angle, so that it is the objective lens, in which rays make the largest angle with the optic axis, which determines the final quality of the image.

The paraxial ray equation which results contains only the z component of the magnetic field evaluated on the optic axis Bz (z). 13) where r is the radial distance of an electron from the optic axis and Vr is the relativistically corrected accelerating voltage. 13) can be used to trace the trajectory of an electron entering the field. For a symmetrical lens, a ray entering parallel to the axis will define all the electron lens parameters discussed in later sections. Note that the approximation has been made that the z component of the field does not depend on r.

Since the lens has a shorter focal length for the loss electrons, with V fixed an objective lens focused on the elastic image will have to be weakened to bring the inelastic image into focus. Thus inelastic loss images appear on the under-focused side of an image where the first Fresnel fringe (see Chapter 3) appears bright and the lens current is too weak. Unfortunately the optimum 44 High-Resolution Electron Microscopy focus condition for high-resolution phase contrast is also on the under-focus side (about 90 nm at 100 kV) so that any inelastic contribution appears as an out-of-focus background blur in the elastic image.

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High-resolution electron microscopy by John C. H. Spence


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