By Virgil E Bottom
Electrical/computer technological know-how and engineering sequence
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Extra info for Introduction to quartz crystal unit design (Van Nostrand Reinhold electrical computer science and engineering series)
T IEEE stcl 119-1979 ANTENNA-RANGE between source and test antennas, and h, is the The signal source itself is usually located at a perpendicular distance from the fixed test remote antenna tower. antenna to the chamber wall. 2 Source Antennas for Antenna Ranges. With nounced, with deep nulls appearing in the the exception of a few highly specialized installations, antenna test ranges are designed to region of the test antenna. operate over a wide band of frequencies. This As the frequency of operation is increased, means that they shall be equipped with a it becomes increasingly difficult to place the family of source antennas and transmitters source antenna near enough to the apex.
Fig 15 shows a second output from each of the 1 kHz i n t e r m e d i a t e - f r e q u e n c y amplifiers feeding an axis-crossing sensor. A S the name implies, each axis-crossing sensor senses the time of the axis crossover of the 1 kHz signal. Specifically it senses each positive axis crossing. At that instant each axis-crossing sensor provides a narrow pulse output. Measurement of the time between axis crossings of the signal in channel A and that in channel B can be directly translated to degrees at 1 kHz, and consequently to the input radio-frequency signal.
If the recorder scales are linearly calibrated in decibels, a logarithmic relative gain pattern results. This format is particularly useful since antenna gain is usually specified in decibels. The decibel scale provides constant resolution over the entire display range, and a wider dynamic range can be displayed than with other formats. Comparison of patterns is also easier with a decibel scale, since a difference in system gain is equivalent to a constant offset of the recorded data. A recording range of 40 dB is most often used, because this range is usually sufficient to show the side lobe levels of interest, and it generally provides sufficient resolution for an examination of the main lobe structure [Fig 21(c)].
Introduction to quartz crystal unit design (Van Nostrand Reinhold electrical computer science and engineering series) by Virgil E Bottom